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Exponentiated Weibull family for analyzing bathtub failure-rate data

JOURNAL ARTICLE published June 1993 in IEEE Transactions on Reliability

Authors: G.S. Mudholkar | D.K. Srivastava

https://doi.org/10.1109/24.229504 Actions

Exponentiated Weibull family for analyzing bathtub failure-rate data

JOURNAL ARTICLE published December 1994 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(94)90359-x Actions

Bathtub failure rate and upside-down bathtub mean residual life

JOURNAL ARTICLE published 1995 in IEEE Transactions on Reliability

https://doi.org/10.1109/24.406570 Actions

The exponentiated Weibull family: a graphical approach

JOURNAL ARTICLE published March 1999 in IEEE Transactions on Reliability

Authors: R. Jiang | D.N.P. Murthy

https://doi.org/10.1109/24.765929 Actions

Graphical techniques for analyzing failure data with the percentile residual-life function

JOURNAL ARTICLE published March 1993 in IEEE Transactions on Reliability

Authors: R.L. Launer

https://doi.org/10.1109/24.210273 Actions

Bathtub failure rate and upside-down bathtub mean residual life

JOURNAL ARTICLE published March 1997 in Microelectronics Reliability

https://doi.org/10.1016/s0026-2714(97)87807-9 Actions

Estimators of 2-parameter Weibull distributions from incomplete data with residual lifetimes

JOURNAL ARTICLE published June 1993 in IEEE Transactions on Reliability

Authors: A.H.C. Tsang | A.K.S. Jardine

https://doi.org/10.1109/24.229503 Actions

Reliability analysis using an additive Weibull model with bathtub-shaped failure rate function

JOURNAL ARTICLE published April 1996 in Reliability Engineering & System Safety

Authors: M. Xie | C.D. Lai

https://doi.org/10.1016/0951-8320(95)00149-2 Actions

Modelling a Bathtub-Shaped Failure Rate by a Coxian Distribution

JOURNAL ARTICLE published June 2016 in IEEE Transactions on Reliability

Authors: Qihong Duan | Junrong Liu

https://doi.org/10.1109/tr.2015.2494374 Actions

On some properties of the bathtub failure rate family of life distributions

JOURNAL ARTICLE published May 1996 in Microelectronics Reliability

Authors: Murari Mitra | Sujit K. Basu

https://doi.org/10.1016/0026-2714(95)00136-0 Actions

A discrete Bayes explanation of a failure-rate paradox

JOURNAL ARTICLE published March 1993 in IEEE Transactions on Reliability

Authors: F.W. Rodrigues | S. Wechsler

https://doi.org/10.1109/24.210284 Actions

A modified Weibull extension with bathtub-shaped failure rate function

JOURNAL ARTICLE published June 2002 in Reliability Engineering & System Safety

Authors: M. Xie | Y. Tang | T.N. Goh

https://doi.org/10.1016/s0951-8320(02)00022-4 Actions

Network reliability evaluation: application of bathtub failure rate curve

JOURNAL ARTICLE published January 1982 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(82)90122-6 Actions

Likelihood Maximization of Lifetime Distributions With Bathtub-Shaped Failure Rate

JOURNAL ARTICLE published June 2023 in IEEE Transactions on Reliability

Research funded by Academy of Finland (330388)

Authors: Teemu J. Ikonen | Francesco Corona | Iiro Harjunkoski

https://doi.org/10.1109/tr.2022.3190542 Actions

Software-reliability growth with a Weibull test-effort: a model and application

JOURNAL ARTICLE published March 1993 in IEEE Transactions on Reliability

Authors: S. Yamada | J. Hishitani | S. Osaki

https://doi.org/10.1109/24.210278 Actions

Approximate inference for location and scale parameters with application to failure-time data

JOURNAL ARTICLE published 1993 in IEEE Transactions on Reliability

Authors: R. Viveros

https://doi.org/10.1109/24.257829 Actions

Network reliability evaluation: Application of bathtub failure rate curve

JOURNAL ARTICLE published January 1981 in Microelectronics Reliability

Authors: Balbir S. Dhillon

https://doi.org/10.1016/0026-2714(81)90549-7 Actions

Distinguishing between lognormal and Weibull distributions [time-to-failure data]

JOURNAL ARTICLE published March 2002 in IEEE Transactions on Reliability

Authors: S.R. Cain

https://doi.org/10.1109/24.994903 Actions

“Weibull” decreasing hazard rate—help or hoax?

JOURNAL ARTICLE published October 1971 in Microelectronics Reliability

https://doi.org/10.1016/0026-2714(71)90119-3 Actions

Prediction intervals for Weibull observations, based on early-failure data

JOURNAL ARTICLE published 1996 in IEEE Transactions on Reliability

Authors: H.K. Hsieh

https://doi.org/10.1109/24.556591 Actions
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